Products
microDAC® CTE - Automated Multi-Sample Measurement of Thermal Expansion Coefficients
microDAC® CTE – Automated Multi-Sample Measurement

Maximum Efficiency in Material Analysis: Determine up to 12 CTE values simultaneously and fully automatically.

Our microDAC® CTE measurement system is the ideal solution for laboratories and production environments that demand highest precision with minimal time expenditure. By eliminating complex sample preparation and enabling parallel acquisition of multiple samples, you save valuable resources.

Product Documentation: Flyer (English) | Flyer (German)
Precision in a Compact Design
  • Real Time Savings: Parallel measurement of up to six samples simultaneously.
  • Comprehensive Data: Simultaneous acquisition of 12 CTE values per measurement run.
  • Bi-directional Analysis: High-precision detection in two spatial directions (x and y).
  • Fully Automated: Automatic test sequence including report generation upon completion.
  • Wide Operating Range: Precise measurements in a temperature range up to 300°C.
  • Compact Design: Space-saving benchtop device for flexible use in any laboratory environment.

Thanks to non-contact measurement technology, mechanical influence on the samples is eliminated, resulting in high-quality and reproducible measurement results.

Applications: Versatility Meets Stability

From civil engineering to the semiconductor industry – the microDAC® CTE provides profound insights for various sectors:

  • Material Research & Development: Characterization of new materials and determination of thermal properties.
  • Electronics & Semiconductors: Minimization of deformation and ensuring the longevity of components.
  • Industrial Quality Assurance: Verification of constant material parameters in the automotive and aerospace industries.
  • Packaging & Logistics: Stability analysis of cold chain packaging and food containers.
  • Civil Engineering & Architecture: Climatic resistance testing of concrete, glass, and metals.

Secure the quality of your products: Use automated characterization to proactively prevent failure mechanisms caused by temperature fluctuations.

Personal Consulting & Contact
Lutz Scheiter
Opt. Metrology / Failure Analysis
Dipl.-Ing. Bettina Seiler
Managing Director
CTE Measuring Device
Focus on Efficiency
Fully automatic determination in x- and y-directions for up to 6 samples in parallel.
CTE Data Analysis
Fast Results
Immediate provision of 12 CTE values including automatic test report generation.
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